Abstract
Low dose imaging procedures are key for a successful cryoEM experiment (whether by electron cryotomography, single particle analysis, electron crystallography, or MicroED). We present a method to minimize magnetic hysteresis of the condenser lens system in the JEOL JEM-3200FSC transmission electron microscope (TEM) in order to maintain a stable optical axis for the beam path of low-dose imaging. The simple procedure involves independent voltage ramping of the CL1 and CL2 lenses immediately before switching to the focusing and exposure beam settings for data collection.
Highlights
Enables consistent horizontal beam position during low-dose mode switching
Facilitates EM automated data collection for the JEOL JEM-3200FSC
Improves beam stability in both TEM imaging and diffraction modes
