Abstract
We have achieved a three fold increase in the speed of transmission electron microscopy by using a beam deflecting mechanism to enable highly efficient acquisition of multiple image tiles for each motion of the mechanical stage. For millimeter-scale areas, the duty cycle of imaging doubles and exceeds 30%, yielding a net average imaging rate of 0.3 gigapixels per second.
Competing Interest Statement
N.K. and H.S.S. disclose financial interests in Zetta AI LLC. C.S.O. and R.A.K. disclose financial interests in Voxa. A.A.W. is a founder and owner of ariadne.ai ag (Switzerland).
Copyright
The copyright holder for this preprint is the author/funder, who has granted bioRxiv a license to display the preprint in perpetuity. It is made available under a CC-BY-NC-ND 4.0 International license.
Posted November 24, 2022.
Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy
