RT Journal Article
SR Electronic
T1 Single-shot super-resolution total internal reflection fluorescence microscopy
JF bioRxiv
FD Cold Spring Harbor Laboratory
SP 182121
DO 10.1101/182121
A1 Min Guo
A1 Panagiotis Chandris
A1 John Paul Giannini
A1 Adam J. Trexler
A1 Robert Fischer
A1 Jiji Chen
A1 Harshad D. Vishwasrao
A1 Ivan Rey-Suarez
A1 Yicong Wu
A1 Clare M. Waterman
A1 George H. Patterson
A1 Arpita Upadhyaya
A1 Justin Taraska
A1 Hari Shroff
YR 2017
UL http://biorxiv.org/content/early/2017/08/29/182121.abstract
AB We demonstrate a simple method for combining instant structured illumination microscopy (SIM) with total internal reflection fluorescence microscopy (TIRF), doubling the spatial resolution of TIRF (down to 115 +/-13 nm) and enabling imaging frame rates up to 100 Hz over hundreds of time points. We apply instant TIRF-SIM to multiple live samples, achieving rapid, high contrast super-resolution imaging in close proximity to the coverslip surface.