User profiles for Kevin R. Coffey

Kevin R Coffey

- Verified email at ucf.edu - Cited by 6934

Kevin R Coffey

- Verified email at uw.edu - Cited by 527

Temperature dependent magnetic properties of highly chemically ordered films

JU Thiele, KR Coffey, MF Toney, JA Hedstrom… - Journal of applied …, 2002 - pubs.aip.org
Magnetic media using materials with high uniaxial magneto-crystalline anisotropy, K U ,
combined with a thermal assist to overcome write field limitations have been proposed as one of …

High anisotropy L1/sub 0/thin films for longitudinal recording

KR Coffey, MA Parker… - IEEE transactions on …, 1995 - ieeexplore.ieee.org
Bulk L1/sub 0/ phase materials, such as CoPt and FePt, are known for their high magnetocrystalline
anisotropy and magnetic moment, properties that are also desirable for high density …

DeepSqueak: a deep learning-based system for detection and analysis of ultrasonic vocalizations

KR Coffey, RE Marx, JF Neumaier - Neuropsychopharmacology, 2019 - nature.com
Rodents engage in social communication through a rich repertoire of ultrasonic vocalizations
(USVs). Recording and analysis of USVs has broad utility during diverse behavioral tests …

Surface and grain-boundary scattering in nanometric Cu films

…, K Barmak, MF Toney, RE Peale, KR Coffey - Physical Review B, 2010 - APS
We report a quantitative analysis of both surface and grain-boundary scattering in Cu thin
films with independent variation in film thickness (27 to 158 nm) and grain size (35 to 425 nm) …

Strong coupling between nanoscale metamaterials and phonons

…, JC Ginn, MB Sinclair, DW Peters, KR Coffey… - Nano …, 2011 - ACS Publications
We use split ring resonators (SRRs) at optical frequencies to study strong coupling between
planar metamaterials and phonon vibrations in nanometer-scale dielectric layers. A series of …

Dominant role of grain boundary scattering in the resistivity of nanometric Cu films

…, K Barmak, MF Toney, RE Peale, KR Coffey - Physical Review B, 2009 - APS
The dominant role of grain boundary scattering in the low-temperature resistivity of both SiO
2 and Ta/SiO 2 encapsulated Cu thin films is demonstrated by the experimental variation …

Phase, grain structure, stress, and resistivity of sputter-deposited tungsten films

…, NT Nuhfer, K Barmak, AP Warren, KR Coffey… - Journal of Vacuum …, 2011 - pubs.aip.org
Sputter-deposited W films with nominal thicknesses between 5 and 180 nm were prepared
by varying the base pressure prior to film deposition and by including or not including …

Grain growth and the puzzle of its stagnation in thin films: The curious tale of a tail and an ear

…, R Sharp, S Ta'asan, AD Rollett, KR Coffey - Progress in Materials …, 2013 - Elsevier
The underlying cause of stagnation of grain growth in thin metallic films remains a puzzle.
Here it is re-visited by means of detailed comparison of experiments and simulations, using a …

Periodically Patterned Au-TiO2 Heterostructures for Photoelectrochemical Sensor

…, K Liang, L Zhou, PD Mani, SJ Florczyk, KR Coffey… - ACS …, 2017 - ACS Publications
Periodically patterned Au nanorods in TiO 2 nanocavities (Au NRs@TiO 2 ) were fabricated
via magnetron sputtering followed by a thermal dewetting process. This innovative Au NRs@…

Electron mean free path of tungsten and the electrical resistivity of epitaxial (110) tungsten films

…, AP Warren, NT Nuhfer, MF Toney, KR Coffey… - Physical Review B, 2012 - APS
This work describes a study of the classical electrical resistivity size effect in tungsten. The
important length scale for this size effect is the isotropic average electron mean free path (…