User profiles for N. M. Shrestha

Niraj Shrestha

- Verified email at rockets.utoledo.edu - Cited by 3900

Nirajman Shrestha

- Verified email at northwestern.edu - Cited by 200

Nabin Manandhar Shrestha

- Verified email at spectrumhealth.org - Cited by 140

Impact of torture on refugees displaced within the developing world: symptomatology among Bhutanese refugees in Nepal

NM Shrestha, B Sharma, M Van Ommeren, S Regmi… - Jama, 1998 - jamanetwork.com
Context.—Most of the world's refugees are displaced within the developing world. The impact
of torture on such refugees is unknown.Objective.—To examine the impact of torture on …

Alcohol and drug abuse in Nepal

NM Shrestha - British journal of addiction, 1992 - Wiley Online Library
… Until a few years ago, heroin users were not using the intravenous method (Shrestha,
1986) but now 37% of heroin dependents are using this (Shrestha, 1989). The number of …

Enhanced e-health framework for security and privacy in healthcare system

NM Shrestha, A Alsadoon, PWC Prasad… - … conference on digital …, 2016 - ieeexplore.ieee.org
Patient health record (PHR) is a rising patient centric model which is frequently outsourced
to store at third party. This addresses the issue in privacy such as hiding the sensitive health …

Simulation study on electrical characteristic of AlGaN/GaN high electron mobility transistors with AlN spacer layer

NM Shrestha, Y Li, EY Chang - Japanese Journal of Applied …, 2014 - iopscience.iop.org
… A thin AlN spacer layer of varying thickness (0–2 nm) and a 25-nm-thick undoped AlGaN
barrier layer are grown on top. The entire epitaxial layer is grown at high temperature. The Al …

Electrical characteristic of AlGaN/GaN high-electron-mobility transistors with recess gate structure

NM Shrestha, Y Li, T Suemitsu… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
… We have explored AlGaN/GaN HEMTs with nonrecess and 3-nm recess gates and achieved
… Notably, the device with gate recess deeper than 3 nm offer increasing Gm with Vth close to …

A novel AlGaN/GaN multiple aperture vertical high electron mobility transistor with silicon oxide current blocking layer

NM Shrestha, YY Wang, Y Li, EY Chang - Vacuum, 2015 - Elsevier
In this work, a new AlGaN/GaN vertical high electron mobility transistor (HEMT) with silicon
oxide (SiO 2 ) current blocking layer (CBL) is designed and studied numerically for high-…

[HTML][HTML] Chronic Lymphocytic Inflammation with Pontine Perivascular Enhancement Responsive to Steroids (CLIPPERS Syndrome): A Case Report and Literature …

NM Shrestha, N Acharya, R Desar - Case Reports in Neurological …, 2023 - hindawi.com
CLIPPERS is a rare, chronic inflammatory neurological syndrome affecting multiple regions
of the brain including the brainstem, cerebellum, and spinal cord. More than 100 cases have …

Design and simulation of high performance lattice matched double barrier normally off AlInGaN/GaN HEMTs

NM Shrestha, Y Li, CH Chen, I Sanyal… - IEEE Journal of the …, 2020 - ieeexplore.ieee.org
… HEMT with a 9-nm-thick recess gate (Sample II) which are shown in Figs… An AlN spacer layer
(1.24 nm) is deposited to enhance the … Finally, 2 nm GaN cap layer is deposited after 8.5 nm

[PDF][PDF] Simulation study of AlN spacer layer thickness on AlGaN/GaN HEMT

NM Shrestha, YY Wang, Y Li, EY Chang - Himalayan Physics, 2013 - researchgate.net
nm thick AlN layer but carrier concentration increases with spacer thickness. Finally, drain
current increases with increasing spacer layer thickness and reach maximum value at 1.2nm

Optimal design of the multiple-apertures-GaN-based vertical HEMTs with current blocking layer

NM Shrestha, Y Li, EY Chang - Journal of Computational Electronics, 2016 - Springer
… Then, \(\hbox {SiO}_{2}\) CBL of thickness varying from 200 to 800 nm are deposited by …
}\) layer is etched for vertical aperture of the device and 50 nm GaN and 15 nm \(\hbox {Al}_{0.25}\…